Method for fabricating a semiconductor storage device having...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reissue Patent

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Details

C438S257000, C438S396000, C438S947000

Reissue Patent

active

RE042004

ABSTRACT:
A semiconductor device of the present invention is a semiconductor memory having a charge storage film. Recesses or holes which effectively increase the capacitance of a floating gate or a memory cell capacitor are formed in the charge storage film. These recesses or holes are formed at the same time the floating gate electrode or the lower electrode of the capacitor is isolated into the form of islands. A dielectric film and a polysilicon film is formed on the isolated island floating gate electrodes or lower electrodes. These recesses or holes increase the surface area of the dielectric film and improve the write and erase characteristics of a memory cell.

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