Method for fabricating a probe pin for testing electrical...

Details Method for fabricating a probe pin for testing electrical... Method for fabricating a probe pin for testing electrical...

2006-04-25

2006-04-25

Chang, Richard (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S842000, C029S825000, C439S093000, C439S886000, C324S761010, C324S1540PB

Reexamination Certificate

active

07032307

ABSTRACT:
A probe pin for testing electric characteristics of a semiconductor device comprises a silicon pin core (3, 23, 33), and a conductive film (4, 24, 34) covering the entire surface, including the bottom face, of the pin core. The bottom face of the probe pin is connected directly to an electrode (7, 37) positioned in or on a print wiring board. A number of probe pins can be connected to the associated electrodes at a high density, thereby forming a fine-pitch probe card having a superior high-frequency signal characteristic.

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