Fishing – trapping – and vermin destroying
Patent
1995-03-16
1997-12-23
Niebling, John
Fishing, trapping, and vermin destroying
437 41, 437239, 437978, H01L 2184
Patent
active
057006997
ABSTRACT:
A method for fabricating the polycrystal silicon TFT under a low temperature which has an improved electron mobility, comprises the steps of forming an oxide film on a substrate, depositing a polycrystal silicon on the oxide film and patterning the polycrystal silicon so that source and drain regions and a channel region remain, growing a gate insulating layer on the patterned polycrystal silicon by ECR plasma thermal oxidation, depositing a material for a gate on the whole surface and removing the material and the gate insulating layer in portions except for a gate region to form the gate, and performing ion implantation on the exposed areas of the polycrystal silicon to form the source and drain regions.
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Lee et al., "High Performance Low Temperature Polysilicon Thin Film Transistor Using ECR Plasma Thermal Oxide as Gate Insulator", IEEE Electron Device Letters, vol. 15, No. 8, Aug. 1994, pp. 301-303.
Lee et al., "ECR Plasma Oxidation Effects on Performance and Stability of Polysilicon Thin Film Transistors", IEDM, pp. 20.3.1-20.3.4, 1994 month unknown.
Little et al., Japanese Journal of Applied Physics, 30(12B), pp. 3724-3728 (1991), month unknown.
Han Chul-Hi
Kim Choong-Ki
Lee Jung-Yeal
Oh Kil-Hwan
Booth Richard A.
LG Electronics Inc.
Niebling John
White John P.
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