Method for fabricating a packaging device for semiconductor...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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C438S125000

Reexamination Certificate

active

10608606

ABSTRACT:
A substantially planar substrate having opposed major surfaces is provided. The substrate includes a through hole that extends between the major surfaces. The through hole is filled with a conductive interconnecting element. A conductive mounting pad and a conductive connecting pad are formed on different ones of the major surfaces in electrical contact with the conductive interconnecting element. The packaging device formed by the method has a volume that is only a few times that of the semiconductor die and can be fabricated from materials that can withstand high-temperature die attach processes. The packaging device can be configured as the only packaging device used in the semiconductor device or as a submount for a semiconductor die that requires a high-temperature die attach process.

REFERENCES:
patent: 2907925 (1959-10-01), Parsons
patent: 5006673 (1991-04-01), Freyman et al.
patent: 5177593 (1993-01-01), Abe
patent: 5298687 (1994-03-01), Rapoport et al.
patent: 5440075 (1995-08-01), Kawakita et al.
patent: 5640048 (1997-06-01), Selna
patent: 5670797 (1997-09-01), Okazaki
patent: 5986885 (1999-11-01), Wyland
patent: 6084295 (2000-07-01), Horiuchi et al.
patent: 6191477 (2001-02-01), Hashemi
patent: 6268654 (2001-07-01), Glenn et al.
patent: 6362525 (2002-03-01), Rahim
patent: 6383835 (2002-05-01), Hata et al.
patent: 6620720 (2003-09-01), Moyer et al.
patent: 6707247 (2004-03-01), Murano
patent: 6828510 (2004-12-01), Asai et al.
patent: 7098593 (2006-08-01), Teng
patent: 2002/0139990 (2002-10-01), Suehiro et al.
patent: 2002/0179335 (2002-12-01), Curcio et al.
patent: 2003/0017645 (2003-01-01), Kabayashi et al.
patent: 2003/0020126 (2003-01-01), Sakamoto et al.
patent: 2003/0040138 (2003-02-01), Kobayashi et al.
patent: 2003/0168256 (2003-09-01), Chien
Syd R. Wilson, Clarence J. Tracy, and John L. Freeman, Jr., “Handbook of Multilevel Metallization for Integrated Circuits”, Noyes Publ., Westwood, New Jersey (1993), pp. 868-872.
Electronic Packaging and Production, “Innovative PCB Reinforcement”, (Feb., 1997), p. 1.
Johannes Adam, “New Correlations Between Electrical Current and Temperature Rise in PCB Traces”, Proc. 20th IEEE Semi-Therm Symp., (Mar. 2004), pp. 1-8.

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