Method for fabricating a field emission device and method...

Electric lamp or space discharge component or device manufacturi – Process – With assembly or disassembly

Reexamination Certificate

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C313S309000, C345S075200

Reexamination Certificate

active

06364730

ABSTRACT:

REFERENCE TO RELATED APPLICATION
Related subject matter is disclosed in a U.S. patent application entitled “Field Emission Device Having an Emitter-Enhancing Electrode,” filed on even date herewith, and assigned to the same assignee.
FIELD OF THE INVENTION
The present invention relates, in general, to methods for fabricating and operating field emission devices, and, more particularly, to methods for conditioning and cleaning electron emitters in a field emission device.
BACKGROUND OF THE INVENTION
It is known in the art that the electron emitters of a field emission device can become contaminated during the operation of the field emission device. The contaminated emissive surfaces typically have electron emission properties that are inferior to those of the initial, uncontaminated emissive surfaces. Several schemes have been proposed for conditioning the electron emitters and removing contaminants from the emissive surfaces thereof.
For example, it is known in the art to decontaminate or condition the emissive surfaces by scrubbing them with an electron beam provided by the electron emitter structures. An example of this scheme is described in U.S. Pat. No. 5,587,720, entitled “Field Emitter Array and Cleaning Method of the Same” by Fukuta et al. However, this type of scheme can result in inefficient cleaning due to the electronic bombardment of surfaces other than the electron emissive surfaces, which can result in undesirable desorption of contaminants.
It is also known in the art to decontaminate or condition the emissive surfaces by applying a high, positive voltage pulse to the gate extraction electrode. This scheme is described in U.S. Pat. No. 5,639,356, entitled “Field Emission Device High Voltage Pulse System and Method” by Levine. Levine teaches that the high, positive voltage pulse increases the electric field at the emissive surfaces, thereby decreasing the adhesion energy of absorbates and facilitating the desorption of contaminants. However, this method does not provide the conditioning benefits realized from an electron scrubbing technique, wherein the emissive surfaces are bombarded with electrons.
Accordingly, there exists a need for a method for enhancing electron emission in a field emission device, which overcomes at least these shortcomings of the prior art.


REFERENCES:
patent: 5189341 (1993-02-01), Itoh et al.
patent: 5209687 (1993-05-01), Konishi
patent: 5587720 (1996-12-01), Fukuta et al.
patent: 5610478 (1997-03-01), Kato et al.
patent: 5639356 (1997-06-01), Levine
patent: 5825134 (1998-10-01), Ito
patent: 5865657 (1999-02-01), Haven et al.
patent: 5969467 (1999-10-01), Matsuno
patent: 6005335 (1999-12-01), Potter
patent: 6042441 (2000-03-01), Konuma

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