Method for fabricating a cylinder-type capacitor utilizing a...

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Reexamination Certificate

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C438S254000, C257SE21648

Reexamination Certificate

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07910452

ABSTRACT:
A method for fabricating a capacitor includes forming an isolation layer over a substrate. The isolation layer forms a plurality of open regions. Storage nodes are formed on surfaces of the open regions. An upper portion of the isolation layer is etched to expose upper outer walls of the storage nodes. A sacrificial layer is formed over the isolation layer to enclose the upper outer walls of the storage nodes. The isolation layer and the sacrificial layer are then removed.

REFERENCES:
patent: 7053435 (2006-05-01), Yeo et al.
patent: 7153740 (2006-12-01), Kim et al.
patent: 7723202 (2010-05-01), Eto
patent: 1020050045608 (2005-05-01), None
patent: 2005-0055077 (2005-06-01), None
patent: 1020060068199 (2006-06-01), None

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