Method for examining a specimen, and scanning microscope system

Details Method for examining a specimen, and scanning microscope system Method for examining a specimen, and scanning microscope system

2005-11-01

2005-11-01

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By shade or color

With color transmitting filter

C250S459100, C359S326000

Reexamination Certificate

active

06961124

ABSTRACT:
A method for examining a specimen (27) that exhibits at least two optical transition lines and is optically excitable at least with light of a first and light of a second wavelength is characterized by the step of illuminating the specimen (27) with illuminating light (15) that generates at least a multiple of the first wavelength and a multiple of the second wavelength; and by the step of detecting the detected light (29) proceeding from the specimen (27).Also disclosed is a scanning microscope system (1) having at least one light source (3) that emits illuminating light (15) for illumination of a specimen (27), the specimen (27) exhibiting at least two optical transition lines and being optically excitable at least with light of a first and light of a second wavelength, having at least one detector (41, 43, 65, 77, 79) for detection of the detected light (29) proceeding from the specimen (27) and an objective (25) for focusing the illuminating light (15) onto a subregion of the specimen (27). The scanning microscope system is characterized in that the illuminating light (15) generates at least a multiple of the first wavelength and a multiple of the second wavelength.

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