Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive
Reexamination Certificate
2006-02-14
2006-02-14
Porta, David (Department: 2878)
Radiant energy
Invisible radiant energy responsive electric signalling
Infrared responsive
C324S727000
Reexamination Certificate
active
06998615
ABSTRACT:
In a method of evaluating a piezoelectric field, non-destructive spectrometry of piezoelectric fields is performed in a semiconductor heterojunction using a technique different from PR spectroscopy. In the method, at first, first and second absorption spectra are measured by irradiating the sample with infrared light at first and second angles, respectively. Then, a peak position of an absorption band having incident-angle dependent intensity is specified, based on the first and second absorption spectra. Thus, the piezoelectric field strength is obtained using a relationship between the piezoelectric field and an electron energy level corresponding to the peak position.
REFERENCES:
patent: 4589783 (1986-05-01), Thomas et al.
patent: 4632549 (1986-12-01), Czabaffy et al.
patent: 4765742 (1988-08-01), Davinson
patent: 5255071 (1993-10-01), Pollak et al.
patent: 5982499 (1999-11-01), Chichester et al.
patent: 6362881 (2002-03-01), Pickering et al.
patent: 2003/0229458 (2003-12-01), Alfano et al.
patent: 3-175340 (1991-07-01), None
Shen et al., “Franz-Keldysh Oscillations In Modulation Spectroscopy,”American Institute of Physics, J. Appl. Phys., Aug. 15, 1995, pp. 2151-2175, vol. 78(4).
Weisbuch et al., “Quantum Semiconductor Structures: Fundamentals and Applications,”Academic Press, 1991, pp. 18-23.
Liu et al., “Intersubband Transitions in Quantum Wells: Physics and Device Applications I,”Academic Press, 2000, pp. 4-19, vol. 62.
Ishikawa Takahide
Takeuchi Hideo
Yamamoto Yoshitsugu
Leydig , Voit & Mayer, Ltd.
Mitsubishi Denki & Kabushiki Kaisha
LandOfFree
Method for evaluating piezoelectric fields does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for evaluating piezoelectric fields, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for evaluating piezoelectric fields will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3654035