Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-07-13
1994-10-18
Warden, Robert J.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356360, G01B 902
Patent
active
053573412
ABSTRACT:
The invention relates to an evaluation method for interferograms and an interferometer corresponding thereto with which tile influence of coherent noise is reduced with simultaneously high interference contrast. Several phase maps are computed from interferograms which are recorded with coherent light. The interferogram components of the test object and the interferogram components of the coherent noise are displaced relative to each other in the camera plane between recording the interferograms. The influence of the coherent noise is suppressed by subsequently averaging the phase maps.
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"Absolute Measurement of Flat Mirrors in the Ritchey-Common Test" by F. M. Kuchel, Workshop on Optical Fabrication and Testing, Oct. 1986.
Freischlad Klaus
Kuchel Michael
Schuster Karl-Heinz
Carl-Zeiss-Stiftung
Ottesen Walter
Thornton Krisanne M.
Warden Robert J.
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