Method for evaluating and correcting total measurement signals

Details Method for evaluating and correcting total measurement signals Method for evaluating and correcting total measurement signals

2011-06-21

2011-06-21

Lau, Tung S (Department: 2857)

Data processing: measuring, calibrating, or testing

Calibration or correction system

Reexamination Certificate

active

07966141

ABSTRACT:
An improved and more accurate method for evaluating and correcting total measurement signals (TS(n)) of measuring devices. The invention concerns a method for evaluating and correcting total measurement signals (TS(n)) of a measuring device, wherein measuring signals are transmitted in the direction of a medium and reflected on a surface of the medium as wanted echo signals or on a surface of a disturbing element as interference signals and received. In the case of a modification of at least one technical, process condition in the container and/or a modification of at least one technical, measurement condition of the measuring device, an independent reference curve is ascertained on the basis of a current static reference curve, wherein the interference signals are masked out of the raw echo curve on the basis of a masking algorithm, which applies the independent reference curve.

REFERENCES:
patent: 5734346 (1998-03-01), Richardson
patent: 44 07 369 (1995-09-01), None
patent: 43 27 333 (1996-08-01), None
patent: 0 928 974 (1999-07-01), None
patent: 2 350 004 (2000-11-01), None
patent: WO 03/016835 (2003-02-01), None

Affiliated with

Also associated with

Rating

Method for evaluating and correcting total measurement signals does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for evaluating and correcting total measurement signals, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for evaluating and correcting total measurement signals will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2735687