Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate
2006-10-10
2006-10-10
Rodriquez, Paul L. (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Modeling by mathematical expression
C702S007000, C702S034000, C702S056000, C702S084000, C702S179000, C702S181000
Reexamination Certificate
active
07120566
ABSTRACT:
A method provides early estimation of product life using accelerated stress testing data. In an embodiment, data measured from a product operating in a first, high-stress environment is used to predict how long the product will operate in a second, normal operating environment before failure, using an exponential acceleration model. An additional feature of the present invention provides a quantified indication of how much the product has improved from a redesign.
REFERENCES:
patent: 5030905 (1991-07-01), Figal
patent: 5210704 (1993-05-01), Husseiny
patent: 5391501 (1995-02-01), Usami et al.
patent: 5539652 (1996-07-01), Tegethoff
patent: 5648919 (1997-07-01), Yamauchi et al.
patent: 5744975 (1998-04-01), Notohardjono et al.
patent: 5789682 (1998-08-01), Dickinson et al.
patent: 5949682 (1999-09-01), Dickinson et al.
patent: 6301970 (2001-10-01), Biggs et al.
patent: 6491528 (2002-12-01), McLean
patent: 6541394 (2003-04-01), Chen et al.
patent: 6546507 (2003-04-01), Coyle et al.
patent: 6684349 (2004-01-01), Gullo et al.
patent: 6816813 (2004-11-01), Tan et al.
Analog Devices's Reliability Handbook. pp. 1-23 out of 86 pages. © 2000.
Military Standard MIL-STD-690C. Mar. 26, 1993.
Hobbs, Gregg. “What HALT and HASS Can Do For Your Products”. © 1997, Nelson Publishing. http://www.evaluationengineering.com/archive/articles/1197halt.htm.
Wesling, Paul. “Advance Program 1stIEEE/CPMT 2-day Workshop on Accelerated Stress Testing, Sep. 7-8, 1995” Aug. 28, 1995. http://www.ewh.ieee.org/soc/cpmt/tc7/ast95.html.
Linear Technology. “Reliability Assurance Program.” Especially p. 11. Undated. www.linear.com/company/quality/RAPweb.pdf. Printed by Examiner on Dec. 27, 2004.
McLean, Harry. “ A Statistical Approach for the Disposition of HALT Issues.” Feb. 15, 2001.
Prakash, Simon. “The Application of HALT and HASS Principles in a High Volume Manufacturing Environment.” Qual. Reliab. Engng. Int., vol. 14, pp. 385-392. © 1998.
Confer, R. et al. “Use of Highly Accelerated Life Test (HALT) to Determine Reliability of Multilayer Ceramic Capacitors.” Proc. 41stElectronic Components and Technology Conf., 1991. pp. 320-322.
Gera, A.E. “The Modified Exponentiated Weibull Distribution for Life-Time Modeling.” Proc. Annual Reliability and Maintainability Symposium. Jan. 16, 1997. pp. 149-152.
Kim, J.S. “A Test of the Exponential MTBF and Comparison of Power Functions of the Random Censoring Case.” IEEE Transactions on Reliability. Apr. 1988. pp. 103-107.
Mudholkar, G.S. et al. “Exponentialted Weibull Family for Analyzing Bathtub Failure-Rate Data.” IEEE Transactions on Reliability. Jun. 1993. pp. 299-302.
Upadhyayula, K. et al. “Guidelines for Physics-of-Failure Based Accelerated Stress Testing.” Proc. Annual Reliability and Maintainability Symposium. Jan. 22, 1998. pp. 345-357.
Scalise, J. “Plastic Encapsulated Microcircuits (PEM) Qualification Testing”. 46thElectronic Components and Technology Conference, May 31, 1996. pp. 392-397.
Siegel, B. “Reliability and the Electronic Engineer”. Intersil Corporation Application Note AN1104. Mar. 24, 1998. http://www.intersil.com/data/an/an1104.pdf.
Weibull.com. “Arrhenius Relationship Introduction.” Printed from the Apr. 23, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010423072851/http://weibull.com/AccelTestWeb/arrhenius—relationship—introduction.htm.
Reliasoft's ALTA 1.0 On-Site Training Guide. © 1999. http://www.reliasoft.org/pubs/alta1—training.pdf.
Shih, C., Lambertson, R., et al. “Characterization and Modeling of a Highly Reliable Metal-to-Metal Antifuse for High-Performance and High-Density Field-Programmable Gate Arrays.” 1997 IEEE Int'l Reliability Physics Symposium (IRPS). Apr. 8, 1997.
Technical Program of IRPS '97. pp. 1-2. Apr. 8, 1997. http://www.irps.org/97-35th/tp97.html.
Internet Archive “Way Back Machine” search results for http://www.weibull.com/acceltestwebcontents.htm.
Weibull.com “Quantitative Accelerated Life Testing Data Analysis: An Overview of Basic Concepts” © 1992-2005. http://www.weibull.com/basics/accelerated.htm.
Weibull.com. “Accelerated Life Testing On—line Reference Contents.” Printed from the Jun. 13, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010613024105/http://weibull.com/acceltestwebcontents.htm.
Weibull.com. “The Mean Life Function.” Printed from the Apr. 30, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010430125329/weibull.com/AccelTestWeb/the—mean—life—function.htm.
Weibull.com. “Arrhenius Exponential.” Printed from the Apr. 23, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010423072436/weibull.com/AccelTestWeb/arrhenius—exponential.htm.
Weibull.com. “Arrhenius Exponential Statistical Properties Summary.” Printed from the Mar. 4, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010304055733/weibull.com/AccelTestWeb/arrhenius—exponential—statistical—properties—....htm.
Weibull.com. “Stresses & Stress Levels” Printed from the Apr. 30, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010430192808/weibull.com/AccelTestWeb/stresses—stress—levels.htm.
Weibull.com. “Accelerated Life Testing” Printed from the Mar. 3, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010303041409/weibull.com/AccelTestWeb/accelerated—life—testing.htm.
Weibull.com. “Types of Accelerated Tests” Printed from the Apr. 22, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010422214528/www.weibull.com/AccelTestWeb/types—of—accelerated—tests.htm.
Weibull.com. “Quantitative Accelerated Life Tests” Printed from the Dec. 17, 2001 archived version stored at Archive.org. http://web.archive.org/web/20011217220235/www.weibull.com/AccelTestWeb/accelerated—life—tests.htm.
Speaks, Scott. “Reliability and MTBF Overview”. Undated document printed from the Internet on May 6, 2006. http://www.vicr.com/documents/quality/Rel—MTBF.
Abernethy, Dr. Robert B. The New Weibull Handbook, 4th Ed. © 2000. pp. v to 1-11. http://quanterion.com/Publications/WeibullHandbook/PrefaceAndTOC.pdf.
Weisstein, Eric W. “Weibull Distribution.” From MathWorld—A Wolfram Web Resource. © 1999. http://mathworld.wolfram.com/WeibullDistribution.html.
Brand Michael K.
McLean Harry W.
Cingular Wireless II LLC
Kenyon & Kenyon LLP
Rodriquez Paul L.
Sharon Ayal
LandOfFree
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