Method for estimating changes in product life for a...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C703S002000, C703S006000, C714S724000, C324S701000, C324S760020, C073S789000

Reexamination Certificate

active

07149673

ABSTRACT:
A method provides early estimation of product life using accelerated stress testing data. In an embodiment, data measured from a product operating in first, high-stress environment is used to predict how long the product will operate in a second, normal operating environment before failure. An additional feature of the present invention provides a quantified indication of how much the product has improved from a redesign.

REFERENCES:
patent: 4866714 (1989-09-01), Adams et al.
patent: 5030905 (1991-07-01), Figal
patent: 5210704 (1993-05-01), Husseiny
patent: 5391502 (1995-02-01), Wei
patent: 5539652 (1996-07-01), Tegethoff
patent: 5648919 (1997-07-01), Yamauchi et al.
patent: 5744975 (1998-04-01), Notohardjono et al.
patent: 5789682 (1998-08-01), Dickinson et al.
patent: 5949682 (1999-09-01), Dickinson et al.
patent: 6301970 (2001-10-01), Biggs et al.
patent: 6491528 (2002-12-01), McLean
patent: 6541394 (2003-04-01), Chen et al.
patent: 6546507 (2003-04-01), Coyle et al.
patent: 6571202 (2003-05-01), Loman et al.
patent: 6684349 (2004-01-01), Gullo et al.
patent: 6816813 (2004-11-01), Tan et al.
Chun Kin Chan et al: Sequential Sampling Plans for Early-Life Reliability Assessment, Annual Reliability and Maintainability Symposium, 1997 Proceedings, Philadelphia, PA, Jan. 13-16, 1997, ISSN 0149-144X, pp. 131-135.
Analog Device's Reliability Handbook. pp. 1-23 out of 88 pages. copyright 2000.
Military Standard MIL-STD-690C. Mar. 26, 1993.
Hobbs, Gregg. “What HALT and HASS Can Do For Your Products”. copyright 1997, Nelson Publishing.
Wiesling, Paul. “Advance Program 1stIEEE/CPMT 2-day Workshop on Accelerated Stress Testing, Sep. 7-8, 1995” Aug. 28, 1995.
Linear Technology, “Reliability Assurance Program”, especially p. 11. Undated. www.linear.com/company/quality/RAPweb.pdf. Printed by Examiner on Dec. 27, 2004.
McLean Harry. “A Statistical Approach for the Disposition of HALT Issues.” Feb. 15, 2001.
Prakash, Simon. “The Application of HALT and HASS Principles in a High Volume Manufacturing Environment.” Qual. Reliab. Engng. Int., vol. 14, pp. 385-392, copyright 1998.
Confer, R. et al. “Use of Highly Accelerated Life Test (HALT) to Determine Reliability of Multilayer Ceramic Capacitors.” Proc. 41stElectronic Components and Technology Conf., 1991. pp. 320-.322.
Gera, A. E. “The Modified Exponentiated Weibull Distribution for Life-Time Modeling.” Proc. Annual Reliability and Maintainability Synmposium, Jan. 16, 1997. pp. 149-152.
Kim, J.S. “A Test of the Exponential MTBF and Comparison of Power Funtions of the Random Censoring Case.” IEEE Transactions on Reliability. Apr. 1988. pp. 103-107.
Mudholkar, G.S. et al. “Exponentiated Weibull Family for Analyzing Bathtub Faiure-Rate Data.” IEEE Transactions on Reliability. Jun. 1993. pp. 299-302. (copy not provided by examiner).
Upadhyayula, K. et al. “Guidelines fro Physics-of-Failure Based Accelerated Stress Testing.” Proc. Annual Reliability and Maintainable Symposium. Jan. 22, 1998. pp. 345-357. (copy not provided by examiner).
Scalise, J. “Plastic Encapsulated Microcircuits (PEM) Qualification Testing.” 46thElectronic Comoponents and Technology Conference, 1996. May 31, 1996. pp. 392-397.
Siegel, B. “Reliability and the Electronic Engineer,” Intersil Corporation Application Note AN1104, Mar. 24, 1998. http://www.intersil.com/data/an/an1104.pdf.
Weibull.com, “Arrhenius Relationship Introduction,” Printed from the Apr. 23, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010423072851/http://weibull.com/AccelTestWeb/arrhenius—relationship—introduction .htm.
Reliasoft's ALTA 1.0 On-Site Training Guide. © 1999 http://www.reliasoft.org/pubs/alta1—training.pdf.
Shih, C., Lambertson, R., et al., “Characterization and Modeling of a Highly Reliable Metal-to-Metal Antifuse for High-Performance and High-Density Field-Programmable Gate Arrays.” 1997 IEEE Int'l Reliability Physics Symposium (IRPS), Apr. 8, 1997.
Technical Program of IRPS '97, pp. 1-2, Apr. 8, 1997 http://www.irps.org/97-35th/tp97.html.
Internet Archive “Way Back Machine” search results for http://www.weibull.com/acceltestwebcontents.htm.
Weibull.com, “Quantitative Accelerated Life Testing Data Analysis: An Overview of Basic Concepts” © 1992-2005 http://www.weibull.com/basics/accelerated.htm.
Weibull.com, “Accelerated Life Testing On—line Reference Contents,” Printed from the Jun. 13, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010613024105/http://weibull.com/acceltestwebcontents.htm.
Weibull.com, “The Mean Life Function,” Printed from the Apr. 30, 2001 archived version at Archive.org. http://web.archive.org/web/20010430125329/weibull.com/AccelTestWeb/the—mean—life—function.htm.
Weibull.com, “Arrhenius Exponential,” Printed from the Apr. 23, 2001 archived version at Archive.org http://web.archive.org/web/20010423072436/weibull.com/AccelTestWeb/arrhenius—exponential.htm.
Weibull.com, “Arrhenius Exponential Statistical Properties Summary,” Printed from the Mar. 4, 2001 archived version stored at Archive.org http://web.archive.org/web/20010304055733/weibull.com/AccelTestWeb/arrhenius—exponential—statistical—properties—....htm.
Weibull.com, “Stresses & Stress Levels,” Printed from the Apr. 30, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010430192808/weibull.com/AccelTestWeb/stresses—stress—levels.htm.
Weibull.com, “Accelerated Life Testing,” Printed from the Mar. 3, 2001 archived version stored at Archive.org. http://web.archive.org/20010303041409/weibull.com/AccelTestWeb/acceleratead—life—testing.htm.
Weibull.com, “Types of Accelerated Tests,” Printed from the Apr. 22, 2001 archived version stored at Archive.org. http://web.archive.org/web/20010422214528/www.weibull.com/AccelTestWeb/types—of—accelerated—tests.htm.
Weibull.com, “Quantitative Accelerated Life Tests,” Printed from the Dec. 17, 2001 archived version stored at Archive.org http://web.archive.org/web/20011217220235/www.weibull.com/AccelTestWeb/accelerated—life—tests.htm.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for estimating changes in product life for a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for estimating changes in product life for a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for estimating changes in product life for a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3667570

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.