Fishing – trapping – and vermin destroying
Patent
1988-04-15
1990-04-24
Hearn, Brian E.
Fishing, trapping, and vermin destroying
437 24, 437239, 437240, H01L 21473
Patent
active
049200763
ABSTRACT:
A method for enhancing the conversion of Si to SiO.sub.2 in a directional fashion wherein steam or wet oxidation of Si is enhanced by the prior implantation of Ge into the Si. The unique advantages of the Ge impurity include the directional enhancement of oxidation and the reduction in thermal budget, while at the same time, Ge is an electrically inactive impurity.
REFERENCES:
patent: 4728619 (1988-03-01), Pfiester et al.
patent: 4743563 (1988-05-01), Pfiester et al.
patent: 4748134 (1988-05-01), Holland et al.
Pfiester et al., "Novel Germanium/Boron Channel-Stop Implantation for Submicron CMOS," IEDM, 12/1987, pp. 740-743.
Ghandhi, VLSI Fabrication Principles, John Wiley & Sons, Inc., 1983, pp. 377-388.
D. Fathy, C. W. White, and O. W. Holland, Mat. Res. Soc. Symp. Proc. vol. 93, pp. 27-33, 1987.
D. Fathy, C. W. White, and D. W. Holland, SPIE vol. 797, pp. 83-87 (1987).
O. W. Holland, C. W. White, and D. Fathy, Appl. Phys. Lett. 51(7), Aug. 17, 1987, pp. 520-522.
D. Fathy, D. W. Holland, and C. W. White, Appl. Phys. Lett. 51(17), pp. 1337-1339, Oct. 26, 1987.
A. S. Grove, et al. J. Appl. Phys. 35, 2695 (1964).
R. Francis, et al. J. Appl. Phys. 50, 280 (1979).
J. F. Gotzlich et al., "Dopant Dependence of the Oxidation Rate of Ion Implanted Silicon," Radiation Eff. 47, 203-210 (1980).
G. Mezey et al., Ion Implantation in Semiconductors, Plenum Press (1976), p. 49.
J. Bevk et al., "Ge-Si Layered Structures: Artificial Crystals and Complex Cell Ordered Superlattices," Appl. Phys. Lett. 49(5); Aug. 4, 1986, pp. 286-288.
J. C. Bean et al., J. Vac. Sci, Techhol. A 2(2), pp. 436-440, Apr.-Jun. 1986.
N. M. Ravindra, Mat. Lett. vol. 4, No. 8, 9, pp. 337-342.
B. E. Deal, J. Appl. Phys. vol. 36, No. 12, pp. 3770-3778, Dec. 1965.
E. A. Irene; J. Electrochemical Soc., pp. 1613-1616, Dec. 1974.
T. Y. Tan et al., Appl. Phys. Lett. 40(7), Apr. 1, 1982, pp. 616-619.
I. S. Williams, Nuc. Ins. Methods 182/183 (1981) 667-673.
Fathy Dariush
Holland Orin W.
White Clark W.
Breeden David E.
Hamel Stephen D.
Hearn Brian E.
Moser William R.
The United States of America as represented by the United States
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