Method for eliminating the fluctuation and drift of spectral lin

Details Method for eliminating the fluctuation and drift of spectral lin Method for eliminating the fluctuation and drift of spectral lin

1995-01-10

1998-04-21

Voeltz, Emanuel T.

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364498, 36457101, 36457104, 356306, 356319, 356326, 2502521A, 25033907, 2502521R, G01V 1300

Patent

active

057425256

ABSTRACT:
This invention is a method for improving the quality of analytical measurement data by eliminating the fluctuation and drift of spectral line intensities obtained by an atomic emission spectrometer or a mass spectrometer. Carrying out this method needs measuring intensities of an analytical line and two reference lines for a sample. This method is involved in the calculation of a sequence of analytical line intensity ratios I.sub.j and a sequence of fluctuation disagreements F.sub.j of intensities between two reference lines, in the use of one of the following three equations

REFERENCES:
patent: 4875169 (1989-10-01), Synovec et al.
patent: 4893259 (1990-01-01), Grosser et al.
patent: 5121337 (1992-06-01), Brown
patent: 5311444 (1994-05-01), Ohta
patent: 5397899 (1995-03-01), DiFoggio et al.

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