Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1982-06-09
1984-07-24
Sikes, William L.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
356389, G01N 2100
Patent
active
044615701
ABSTRACT:
A method for dynamically recording distortion in a transparency includes a support fixture for mounting the transparency for movement about a predetermined horizontal or vertical axis, with a camera disposed in back of the transparency while a test target is disposed in front of it. The test target has a plurality of small light sources arranged in a rectangular matrix pattern toward which the camera is aimed through the transparency. By opening the camera shutter for a period of time as the transparency is moved through a predetermined angle, a photographic record of distortion at a plurality of regions in the transparency is produced.
REFERENCES:
patent: 4099877 (1978-07-01), Brouwer
patent: 4299482 (1981-11-01), Task
Hammond et al., "Detecting Surface Deformities," IBM Tech. Disclo. Bull., vol. 14, No. 1, pp. 49-50, Jun. 1971.
Herman et al., "Methods and Apparatus for Detecting Deviations from Planarity," Technical Digest, pub. by Western Electric, " No. 44, pp. 27-28, Oct. 1976.
Genco, Louis V. and Task, Harry L., "Aircraft Transparency Optical Quality: New Methods of Measurement," Feb. 1981, Report No. AFAMRL-TR-81-21.
Self, Hershel C. and Task, Harry L., "Potential of Optical Analysis for Measuring Windscreen Distortion," Dec. 1980, Report No. AFAMRL-TR-80-104.
Genco Louis V.
Task Harry L.
Flanagan John R.
Koren Matthew W.
Sikes William L.
Singer Donald J.
The United States of America as represented by the Secretary of
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