Method for direct phase measurement of radiation, particularly l

Details Method for direct phase measurement of radiation, particularly l Method for direct phase measurement of radiation, particularly l

1990-09-13

1992-10-13

Berman, Jack I.

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

356359, G01J 902

Patent

active

051553635

ABSTRACT:
A method for direct phase measurement of radiation, more particularly light radiation, which is reflected by a body or object with a diffusely reflecting surface. In order to make possible measurement of the phase with the production of a single image, the object or body is irradiated with coherent radiation having a predetermined frequency. The reflected radiation is used to produce an image in an image plane using an image forming optical system, a sensor with a plurality of preferably regularly arranged sensor elements being located in the plane. There is a superimposition of reference radiation on the sensor with the same frequency and with a defined phase relationship. In the case of directed object rays coming from a mirror-like body or object, the reference beam is set so that one period of the interference field produced on the sensor by the superimposition of the object and reference beams covers at least three sensor elements. The image forming optical system is designed and set so that the images of the speckles produced by the radiation on the object or body cover at least three sensor elements in the image plane. The phase of the radiation from the object or body is determined on the basis of the intensity signals of the at least three sensor elements.

REFERENCES:
patent: 4583855 (1986-04-01), Bareket
patent: 4611288 (1986-09-01), Duret et al.
patent: 4910404 (1990-03-01), Cho et al.
patent: 4964770 (1990-10-01), Steinbichler et al.
patent: 4987545 (1991-01-01), Dirtoft
Yamaguchi, I., "A Laser-Speckle Strain Gauge", J. Phys. E. Sci. Instrum, vol. 14, No. 11 (1981), pp. 1270-1273.

Affiliated with

Also associated with

Rating

Method for direct phase measurement of radiation, particularly l does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for direct phase measurement of radiation, particularly l, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for direct phase measurement of radiation, particularly l will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1302935