Abrading – Abrading process – Utilizing shield
Reexamination Certificate
2006-10-17
2006-10-17
Ackun, Jr., Jacob K. (Department: 3723)
Abrading
Abrading process
Utilizing shield
C451S038000
Reexamination Certificate
active
07121925
ABSTRACT:
A method for dividing a semiconductor wafer into chips according to the present invention is a method for dividing a semiconductor wafer into a large number of semiconductor chips, the semiconductor wafer having a semiconductor layer formed on a substrate. A first method includes the step of forming a blast-resistant mask on a surface of the semiconductor wafer, the blast-resistant mask having a pattern for leaving a grid-like exposed portion as it is and the step of blasting a fine particular blast material to thereby form dividing grooves reaching a predetermined depth of the substrate in the grid-like exposed portion. A second method includes the step of forming first dividing grooves in a surface of the semiconductor wafer in which the semiconductor layer is formed, by dicing, etching or blasting, so that the first dividing grooves have a relatively narrow groove width, and the step of forming second dividing grooves in a surface of the semiconductor wafer in which the semiconductor layer is not formed by dicing, and in positions corresponding to the first dividing grooves, so that the second dividing grooves have a relatively wide groove width.
REFERENCES:
patent: 5197234 (1993-03-01), Gillenwater
patent: 5508206 (1996-04-01), Glenn et al.
patent: 5593528 (1997-01-01), Dings et al.
patent: 5804009 (1998-09-01), Dings et al.
patent: 5989689 (1999-11-01), Komatsu
patent: 6033927 (2000-03-01), Shibata et al.
patent: 6342404 (2002-01-01), Shibata et al.
patent: 54-88767 (1979-07-01), None
patent: 55-83236 (1980-06-01), None
patent: 56-48148 (1981-05-01), None
patent: 02-43754 (1990-02-01), None
patent: 05-166923 (1993-07-01), None
patent: 05-315646 (1993-11-01), None
patent: 05-343742 (1993-12-01), None
patent: 07-131069 (1995-05-01), None
patent: 10-125958 (1998-05-01), None
patent: 11-177139 (1999-07-01), None
patent: 11-354841 (1999-12-01), None
patent: 242695 (1995-03-01), None
patent: 293135 (1996-12-01), None
International Search Report dated May 31, 2001 with partial translation.
Taiwanese Office Action dated Apr. 4, 2003 with Japanese Translation.
Examiner's comment on Taiwanese Patent No. 293135 published on Dec. 11, 1996.
Taiwanese Office Action dated May 17, 2004 with Japanese Translation.
Hashimura Masaki
Ota Koichi
Sato Takao
Ackun Jr. Jacob K.
McGinn & Gibb PLLC
Toyoda Gosei Co,., Ltd.
LandOfFree
Method for dicing semiconductor wafer into chips does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for dicing semiconductor wafer into chips, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for dicing semiconductor wafer into chips will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3716394