Method for diagnosing open defects on non-contacted nodes of...

Details Method for diagnosing open defects on non-contacted nodes of... Method for diagnosing open defects on non-contacted nodes of...

2006-06-06

2006-06-06

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S530000, C324S531000, C324S763010, C324S765010

Reexamination Certificate

active

07057395

ABSTRACT:
A method and apparatus for diagnosing open defects on non-contacted nodes of an electrical device is presented. Actual and expected signal measurements are collected for various contacted nodes of the electrical device. Nodes whose actual measurements are out of range of their respective expected measurements are deemed abnormal nodes. Non-contacted nodes may then be assessed as having, or as likely to have, open defects based on knowledge of the degree of coupling of the non-contacted node to the abnormal contacted nodes. In the preferred embodiment, abnormal nodes are identified using a linear regression analysis, and the non-contacted nodes indicted as having open defects are identified using a weighting scheme.

REFERENCES:
patent: 5110477 (1992-05-01), Howard et al.
patent: 5391993 (1995-02-01), Khazam et al.
patent: 5420500 (1995-05-01), Kerschner
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 6005394 (1999-12-01), Majka et al.
patent: 6536007 (2003-03-01), Venkataraman
patent: 6717415 (2004-04-01), Sunter
patent: 2003/0231028 (2003-12-01), Liu
patent: 2005/0099186 (2005-05-01), Parker et al.

Affiliated with

Also associated with

Rating

Method for diagnosing open defects on non-contacted nodes of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for diagnosing open defects on non-contacted nodes of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for diagnosing open defects on non-contacted nodes of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3676569