Method for determining waveguide facet reflectivity

Details Method for determining waveguide facet reflectivity Method for determining waveguide facet reflectivity

1998-09-17

2000-08-08

Font, Frank G.

Optics: measuring and testing

For optical fiber or waveguide inspection

385 49, 385 50, G02B 630

Patent

active

061009687

ABSTRACT:
A method for determining waveguide facet reflectivity from the electric field propagated from an optical fiber into an optical waveguide. The method determines the electric field propagated from the optical fiber into the optical waveguide by combining field terms resulting from multiple reflections occurring at an endface of the optical fiber and an input facet of the optical waveguide; determines the amount of optical field transmitted into the waveguide as a function of gap distance between the optical fiber and the waveguide; determines the optical power transmitted into the waveguide from the amount of field transmitted into the waveguide; and determines the waveguide facet reflectivity from the determined amount of optical power transmitted into the waveguide.

REFERENCES:
patent: 4102559 (1978-07-01), Hunzinger
patent: 5875274 (1999-02-01), Stein
M. N. Khan, J. E. Zucker, T. Y. Chang, N. J. Sauer, and H. M. Presby, "Low Coupling Loss between Quantum Well Electron Transfer Waveguide Modulator and Single Mode Fiber," IEEE LEOS '94 Annual Meeting, Boston, MA, vol. 2, Nov., 1994, pp. 289-290.
J. Stone and L. W. Stulz, "Reflectance, transmittance, and loss spectra of multilayer Si/SiO.sub.2 thin film mirrors and antireflection coatings for 1.5 .mu.m," Applied Optics, vol. 9, No. 4, Feb. 1990, pp. 583-587.

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