Method for determining undershoot resistance of an electronic de

Details Method for determining undershoot resistance of an electronic de Method for determining undershoot resistance of an electronic de

1988-12-27

1991-04-09

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 725, 371 151, G01R 3128

Patent

active

050068075

ABSTRACT:
A method for determining the undershoot resistance of an electronic device having input and output pins. The method comprises the steps of selecting an input pin to test, providing a high voltage to at least one nonselected input pin, applying a negative voltage spike to the selected input pin, and monitoring output pins not logically connected to the input pin for disturbances in their output voltage levels. The high voltage, and the amplitude and pulse width of the negative voltage spike are incrementally changed and, of any pin has a disturbance in its output voltage, are recorded.

REFERENCES:
patent: 3531718 (1970-09-01), Hamilton et al.
patent: 4096402 (1978-06-01), Schroeder et al.
patent: 4268785 (1981-05-01), Svendsen
patent: 4694242 (1987-09-01), Peterson et al.
patent: 4749882 (1988-06-01), Morgan
patent: 4791359 (1988-12-01), Raymond et al.
patent: 4800332 (1989-01-01), Hutchins
patent: 4837502 (1989-06-01), Ugenti

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