Method for determining transport critical current densities and

Details Method for determining transport critical current densities and Method for determining transport critical current densities and

1990-08-22

1992-07-21

Snow, Walter E.

Superconductor technology: apparatus, material, process

High temperature , per se

Having tc greater than or equal to 150 k

505726, 505727, 324228, 324262, H01B 1200, H01L 3912

Patent

active

051322790

ABSTRACT:
A contact-less method for determining transport critical current density and flux penetration depth in bulk superconductor material. A compressor having a hollow interior and a plunger for selectively reducing the free space area for distribution of the magnetic flux therein are formed of superconductor material. Analytical relationships, based upon the critical state model, Maxwell's equations and geometrical relationships define transport critical current density and flux penetration depth in terms of the initial trapped magnetic flux density and the ratio between initial and final magnetic flux densities whereby data may be reliably determined by means of the simple test apparatus for evaluating the current density and flux penetration depth.

REFERENCES:
patent: 4939458 (1990-07-01), Yarar et al.

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