Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2011-01-04
2011-01-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07865327
ABSTRACT:
A method for determining the temperature or the ohmic resistance of an electrical component, especially of a coil of a magnetic valve. The component temperature is estimated with the aid of a temperature model, which is able to determine the curve of the component temperature even during a control of the valve. The temperature model is corrected regularly based on the measured value, in this context.
REFERENCES:
patent: 5788028 (1998-08-01), Bieber
patent: 6986413 (2006-01-01), Fedders et al.
patent: 2003/0097849 (2003-05-01), Taguchi
patent: 2006/0230770 (2006-10-01), Kitsch
patent: 2009/0265066 (2009-10-01), Ogawa et al.
patent: 10 2006 041 193 (2008-03-01), None
Grotheer Olaf
Koehler Ingo
Bui Bryan
Kenyon & Kenyon LLP
Robert & Bosch GmbH
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