Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1998-06-26
2000-03-07
Kim, Robert H.
Optics: measuring and testing
By polarized light examination
With birefringent element
356345, 356357, G01B 902
Patent
active
060347740
ABSTRACT:
A method for determining the optical retardation of an anisotropic material. A beam of light is directed toward a sample of the material and a portion of the reflected beam is collected from the optical interfaces of the material and directed toward an interferometer. The resulting interference signal is analyzed to determine the retardation. The retardation is determined as being the distance between particular peaks of the interference signal. In a further embodiment, light from multiple wavelength light sources is directed toward the sample of the material.
REFERENCES:
patent: 3930167 (1975-12-01), Hsiao
patent: 4042723 (1977-08-01), Presby
patent: 4254337 (1981-03-01), Yasujima et al.
patent: 4650329 (1987-03-01), Barrett et al.
patent: 4799001 (1989-01-01), Burch
patent: 4950074 (1990-08-01), Fabricius et al.
patent: 5262842 (1993-11-01), Gauglitz
patent: 5285424 (1994-02-01), Meyer
patent: 5291268 (1994-03-01), Tank et al.
patent: 5323229 (1994-06-01), May et al.
patent: 5473432 (1995-12-01), Sorin
patent: 5563707 (1996-10-01), Prass et al.
patent: 5596409 (1997-01-01), Marcus et al.
patent: 5610716 (1997-03-01), Sorin et al.
patent: 5659392 (1997-08-01), Marcus et al.
"An interferometric method to measure transient refractive index, birefringence and thickness variation of solids." By Theocaris et al, published in Journal of Physics E, vol. 8, No. 7, pp. 611-614, Jul. 1975.
Lee Jiann-Rong
Marcus Michael A.
Eastman Kodak Company
Kim Robert H.
Lee Andrew H.
Parulski Susan L.
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