Method for determining the reflectance profile of materials

Details Method for determining the reflectance profile of materials Method for determining the reflectance profile of materials

2005-11-08

2005-11-08

Rosenberger, Richard A. (Department: 2877)

Optics: measuring and testing

Of light reflection

Reexamination Certificate

active

06963403

ABSTRACT:
The present invention relates to a method for determining the reflectance profile of materials and more particularly, the present invention relates to a method for calculating specular and diffuse reflectance and hence, the emittance of materials at ambient temperatures.

REFERENCES:
patent: 4618541 (1986-10-01), Forouhi et al.
patent: 5132922 (1992-07-01), Khan et al.
patent: 5597868 (1997-01-01), Kunz
Simmons, E.L., “Diffuse reflectance spectroscopy: a comparison of the theories”, Applied Optics, vol. 14, No. 6, Jun. 1975, pp. 1380-1386.
Garbuny, Max, “Optical Physics”, Academic Press, New York, New York, 1965.

Affiliated with

Also associated with

Rating

Method for determining the reflectance profile of materials does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for determining the reflectance profile of materials, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining the reflectance profile of materials will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3505293