Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-03-20
1991-05-28
Wieder, Kenneth
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
32420726, 324236, 324603, 324605, 328 5, 328223, 331 65, 361179, G01R 2728
Patent
active
050197827
ABSTRACT:
Method for determining qualities and/or frequencies of electrical tuned circuits. The method includes the steps of exciting the turned circuit with a switching pulse which has a short rise and fall time as compared with a period corresponding to the resonant frequency of the circuit, and evaluating the oscillation dying out after the switching impulse.
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patent: 4446427 (1984-05-01), Lovrenich
patent: 4560929 (1985-12-01), Melnyk
patent: 4843259 (1989-06-01), Weisshaupt
Electronics, vol. 45, No. 21, Oct. 9, 1972, pp. 119-120.
"Electronic Measurements", 2nd Edition, 1952, pp. 332 and 333.
Hewlett-Packard Journal, vol. 28, No. 1, Sep. 1976, pp. 9 and 15.
International Journal of Electronics, vol. 55, Oct. 1983, pp. 625 to 630.
Sensenbaugh, "Proximity Detector", IBM Technical Disclosure Bulletin, vol. 13, No. 18 (Jan. 1971), pp. 2230-2231.
Greenberg Laurence A.
Lerner Herbert L.
Mueller Robert W.
Siemens Aktiengesellschaft
Wieder Kenneth
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