Optics: measuring and testing – Of light reflection – With diffusion
Reexamination Certificate
2006-08-01
2006-08-01
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
Of light reflection
With diffusion
C356S445000, C356S600000, C250S559010
Reexamination Certificate
active
07084981
ABSTRACT:
The invention relates to a method for determining the paper quality for halftone printing, according to which a finely distributed pattern of geometric figures is applied to the paper, said paper is then illuminated and the light that is reflected and scattered by the paper is observed. The method is characterized in that the pattern is applied to an optical transparent planar element, the side of said element bearing the pattern is brought into contact with the surface of the paper and the paper is pressed against the planar element.
REFERENCES:
patent: 4541273 (1985-09-01), Bery
patent: 5146097 (1992-09-01), Fujiwara et al.
patent: 6153038 (2000-11-01), Brooker
patent: 06286325 (1994-10-01), None
patent: WO 00/39749 (2000-07-01), None
patent: WO 03/005004 (2003-01-01), None
Alix Yale & Ristas, LLP
Lee Hwa (Andrew)
Merlino Amanda
Nordland Papier GmbH
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