Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science
Patent
1998-07-09
2000-12-12
McElheny, Jr., Donald E.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Earth science
G06F 1900
Patent
active
061610755
ABSTRACT:
A method of estimating expected errors of environmental data parameters based on radiance measurements obtained from visible infra red radiometric satellite sensors (VIIRS) orbiting the earth, comprising the steps of: obtaining N radiance measurements of a surface body I.sub.I, . . . ,I.sub.N defining matrix I depending on p unknown surface and atmospheric parameters T.sub.i, . . . T.sub.p, defining a matrix T; generating a forward model I=f(T) for obtaining the I radiance measurements from the p parameters; choosing an initial set of values for the p parameters and linearizing f(T) about the initial values to obtain a linearized forward I=s+H.theta. as f.sub.i (T.sub.01, T.sub.02, . . . T.sub.0p)+.SIGMA.H.sub.ij .theta..sub.j where I=1,2, . . . N and .theta..sub.j =T.sub.oj and H.sub.ij =.delta.f.sub.i /.delta.T.sub.j and where .theta. is a column matrix .theta..sub.l, . . . .theta..sub.p and H is a matrix of H.sub.ij values; adding measurement noise vector w of noise values to the forward model; determining the covariance of the measurement noise w to obtain a covariance matrix C; and manipulating the matrices H and C according to the equation C.sub.EDR =(H.sup.T C.sup.-1 H).sup.-1 to obtain matrix element C.sub.EDR indicative of the expected errors in the values of T.sub.1, . . . T.sub.p parameters.
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Elbaum Saul
ITT Manufacturing Enterprises Inc.
McElheny Jr. Donald E.
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