Electrophotography – Control of electrophotography process – Having temperature or humidity detection
Reexamination Certificate
2004-03-12
2009-02-10
Nguyen, Vincent Q (Department: 2831)
Electrophotography
Control of electrophotography process
Having temperature or humidity detection
C348S243000, C348S246000
Reexamination Certificate
active
07489883
ABSTRACT:
An imager temperature sensor and a current correction apparatus are provided which use dark pixel measurements from an imager chip during operation together with a fabrication process constant as well as a chip dependent constant to calculate chip temperature. The chip temperature may be used to generate a current correction signal. The correction signal is used to tune a current on the imager chip to correct for temperature variations.
REFERENCES:
patent: 4162411 (1979-07-01), Sakaue et al.
patent: 4739495 (1988-04-01), Levine
patent: 4744672 (1988-05-01), Tursky et al.
patent: 4862237 (1989-08-01), Morozumi
patent: 5008739 (1991-04-01), D'Luna et al.
patent: 5047863 (1991-09-01), Pape et al.
patent: 5452001 (1995-09-01), Hosier et al.
patent: 5625413 (1997-04-01), Katoh et al.
patent: 5886353 (1999-03-01), Spivey et al.
patent: 5929689 (1999-07-01), Wall
patent: 5953060 (1999-09-01), Dierickx
patent: 6101287 (2000-08-01), Corum et al.
patent: 6144408 (2000-11-01), MacLean
patent: 6271880 (2001-08-01), Kameshima et al.
patent: 6303923 (2001-10-01), Wadsworth et al.
patent: 6330345 (2001-12-01), Russo et al.
patent: 6418241 (2002-07-01), Schreiner
patent: 6607301 (2003-08-01), Glukhovsky et al.
patent: 2003/0071196 (2003-04-01), Seitz
patent: 2003/0202111 (2003-10-01), Park
patent: 2004/0032627 (2004-02-01), Tsai
patent: 2004/0251915 (2004-12-01), Hagerling et al.
patent: 02022873 (1990-01-01), None
AN03: Guide to Image Quality and Pixel Correction Methods, Rad-Icon Imaging Corp.
Anton Bakker and John H. Huijsing; Micropower CMOS Temperature Sensor with Digital Output, IEEE Journal of Solid-State Circuits, vol. 31, No. 7, Jul. 1996, pp. 933-937.
Karim Arabi and Bozena Kaminska, Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures, Proceedings of the 1997 International Conference on Computer Design (ICCD '97), pp. 462-467.
Louis Luh, John Choma, Jr., Jeffrey Draper, Herming Chiueh, A High-Speed CMOS On-Chip Temperature Sensor, Proceedings of the European Solid State Circuits Conference, Sep. 1999, pp. 290-293.
V. Szekely, M. Rencz and B. Courtois, Integrating On-chip Temperature Sensors into DfT Schemes and BIST Architectures, Proceedings of the 15th IEEE VLSI Test Symposium, IEEE, (1997), pp. 440-445.
M. Loose, K. Meier, J. Schemmel, Self-calibrating logarithmic CMOS image sensor with single chip camera functionality, Contribution to IEEE CCD & AIS workshop, Karuizawa, Japan (1999) R27.
Hon-Sum Wong, Technology and Device Scaling Considerations for CMOS Imagers, IEEE Transactions on Electron Devices, vol. 43, No. 12, Dec. 1996, pp. 2131-2142.
Eric R. Fossum, Digital Camera System on a Chip, IEEE Micro, May-Jun. 1998, pp. 8-15.
C. C. Lui and C. H. Mastrangelo, CMOS Uncooled Heat-Balancing Infrared Imager, IEEE Journal of Solid-State Circuits, Apr. 2000, pp. 1-9.
Agranov Gennadiy A.
Rossi Giuseppe
Aptina Imaging Corporation
Dickstein , Shapiro, LLP.
Nguyen Vincent Q
LandOfFree
Method for determining temperature of an active pixel imager... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for determining temperature of an active pixel imager..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining temperature of an active pixel imager... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4053624