Method for determining superficial residual stress as...

Details Method for determining superficial residual stress as... Method for determining superficial residual stress as...

2005-08-23

2005-08-23

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

C702S043000, C702S105000

Reexamination Certificate

active

06934642

ABSTRACT:
A novel economical method for determining the residual stress levels in machined, mechanically or thermally processed components and for determining whether the stress is tensile or compressive. Also provided is a system including components for accomplishing the method of the present invention. Also provided is a method of modeling of a component residual stress from production of raw billet through to a finished component.

REFERENCES:
patent: 4964305 (1990-10-01), Raulins
patent: 6643488 (2003-11-01), Yoshida
patent: 6721667 (2004-04-01), Banes et al.
Proffen, et al., Interactive Guide to Diffraction, http://www.uni-wuerzburg.de/mineralogie/crystal/teaching/teaching.html (2003). 8 pages.
Simes, et al., “A Note on the Influence of Residual Stress on Measured Hardness, Research Note”, Journal of Strain Analysis,19(2):135-137 (1984).
Tissue B.M., Chemistry Hypermedia Project, http://www.chem.vt.edu/chem-ed/diffraction
eutron.html (2000). 4 pages.

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