Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2007-01-16
2007-01-16
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C702S057000, C702S116000, C702S117000
Reexamination Certificate
active
11063072
ABSTRACT:
One use for delay adjustment circuit (32), coarse-grain delay offset circuit (34), and fine grain delay systhesis circuit (36) may be as part of a delay replication circuit (30) used to replicate the frequency versus voltage behavior of an integrated circuit (29). Also, a circuit (30) and method for determining optimal power and frequency metrics of integrated circuit (29) is also described. In addition, a method for determining programmable coefficients to replicate frequency and supply voltage correlation is described.
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Freescale Semiconductor Inc.
Hill Susan C.
Hoff Marc S.
King Robert L.
Suarez Felix
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