Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-03-29
2011-03-29
Barbee, Manuel L (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C320S132000
Reexamination Certificate
active
07917315
ABSTRACT:
A method for counting electrons from a power supply, comprising the following steps: measuring a current of a power supply forming a measured current; converting the measured current to a voltage; then into a monotonic uni-polar representation of an aggregate number of electrons having an amplitude; actuating a microprocessor in communication with a data storage just before an integrator in communication with the power supply reaches a preset limit of aggregate electrons; reading the amplitude forming a reading; transmitting the reading to an accumulator forming an accumulator value; resetting the integrator after the transmitting the reading, repeating the actuation, reading and transmission; comparing the summation of accumulator values to a calibration value; and recording the capacity when the summation of accumulator values meets or exceeds the calibration value.
REFERENCES:
patent: 5614829 (1997-03-01), Song
patent: 7397217 (2008-07-01), Van Brocklin et al.
Benckenstein Claude Leonard
Davis Clint Alfred
Perkins Dean
Barbee Manuel L
Fulbright & Jaworski L.L.P.
Southwest Electronic Energy Corporation
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