Method for determining poor performing cells

Details Method for determining poor performing cells Method for determining poor performing cells

2007-08-28

2007-08-28

West, Jeffrey R. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S065000, C702S079000, C429S090000

Reexamination Certificate

active

11015991

ABSTRACT:
A means for determining long-term discharge performance, particularly in a lithium/silver vanadium oxide cell, by analyzing and characterizing the initial pulse voltage waveform, is described. The relationship between the initial P1 (Pmin) voltage drop and the extent of that initial voltage drop with Plast(the final voltage under load) is a reliable indication of long-term discharge performance.

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