Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2007-01-12
2009-02-17
Sugarman, Scott J (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
C351S246000
Reexamination Certificate
active
07490940
ABSTRACT:
An apparatus for determining the objective refraction of a patient's eye includes a transparent window and a wavefront measurement device that determines aberrations in a return beam from the patient's eye after the beam passes through a corrective test lens in the apparatus. The wavefront measurement device outputs an instant display representative of the quality of vision afforded the patient through the test lens. The display can be a representation of a Snellen chart, convoluted with the optical characteristics of the patient's vision, an overall quality of vision scale or the optical contrast function, all based on the wavefront measurements of the patient's eye. The examiner may use the display information to conduct a refraction examination and other vision tests without the subjective response from the patient.
REFERENCES:
patent: 4105302 (1978-08-01), Tate, Jr.
patent: 4711576 (1987-12-01), Ban
patent: 5062702 (1991-11-01), Bille
patent: 5080477 (1992-01-01), Adachi
patent: 5164750 (1992-11-01), Adachi
patent: 5528321 (1996-06-01), Blum et al.
patent: 5777719 (1998-07-01), Williams et al.
patent: 5929970 (1999-07-01), Mihashi
patent: 5949521 (1999-09-01), Williams et al.
patent: 5963300 (1999-10-01), Horwitz
patent: 6007204 (1999-12-01), Fahrenkrug et al.
patent: 6050687 (2000-04-01), Bille et al.
patent: 6086204 (2000-07-01), Magnante
patent: 6095651 (2000-08-01), Williams et al.
patent: 6112114 (2000-08-01), Dreher
patent: 6120150 (2000-09-01), Sarver et al.
patent: 6155684 (2000-12-01), Bille et al.
patent: 6199986 (2001-03-01), Williams et al.
patent: 6234631 (2001-05-01), Sarver et al.
patent: 6256098 (2001-07-01), Rubinstein et al.
patent: 6257723 (2001-07-01), Sarver et al.
patent: 6270221 (2001-08-01), Liang et al.
patent: 6271915 (2001-08-01), Frey et al.
patent: 6299311 (2001-10-01), Williams et al.
patent: 6305802 (2001-10-01), Roffman et al.
patent: 6309068 (2001-10-01), Kohayakawa
patent: 6338559 (2002-01-01), Williams et al.
patent: 6379005 (2002-04-01), Williams et al.
patent: 6379008 (2002-04-01), Chateau et al.
patent: 6382795 (2002-05-01), Lai
patent: 6394605 (2002-05-01), Campin et al.
patent: 6396588 (2002-05-01), Sei
patent: 6460997 (2002-10-01), Frey et al.
patent: 6499843 (2002-12-01), Cox et al.
patent: 6511180 (2003-01-01), Guirao et al.
patent: 6547392 (2003-04-01), Fujieda
patent: 6550917 (2003-04-01), Neal et al.
patent: 6554429 (2003-04-01), Campin et al.
patent: 6607274 (2003-08-01), Stantz et al.
patent: 6679606 (2004-01-01), Campin et al.
patent: 6761454 (2004-07-01), Lai et al.
patent: 6786602 (2004-09-01), Abitbol
patent: 6802605 (2004-10-01), Cox et al.
patent: 7114808 (2006-10-01), Lai et al.
patent: 2001/0033362 (2001-10-01), Sarver
patent: 2001/0035939 (2001-11-01), Mihashi et al.
patent: 2001/0041884 (2001-11-01), Frey et al.
patent: 2002/0047992 (2002-04-01), Graves et al.
patent: 2002/0122153 (2002-09-01), Piers et al.
patent: 2002/0140902 (2002-10-01), Guirao et al.
patent: 2002/0167643 (2002-11-01), Youssefi
patent: 2002/0186346 (2002-12-01), Abitbol
patent: 2002/0196412 (2002-12-01), Abitbol
patent: 2003/0011745 (2003-01-01), Molebny et al.
patent: 2003/0076478 (2003-04-01), Cox
patent: 2003/0151721 (2003-08-01), Lai et al.
patent: 2003/0210378 (2003-11-01), Riza
patent: 2004/0169820 (2004-09-01), Dai et al.
patent: 42 22 395 (1994-01-01), None
patent: 1 153 570 (2001-11-01), None
patent: WO-92/01417 (1992-06-01), None
patent: WO-98/27863 (1998-07-01), None
patent: WO-00/10448 (2000-03-01), None
patent: WO-00/19885 (2000-04-01), None
patent: WO-01/47449 (2001-07-01), None
patent: WO-01/58339 (2001-08-01), None
patent: WO-01/82791 (2001-11-01), None
patent: WO-01/89424 (2001-11-01), None
patent: WO-02/09579 (2002-02-01), None
patent: WO-02/19901 (2002-03-01), None
patent: WO-02/28272 (2002-04-01), None
patent: WO-02/30273 (2002-04-01), None
patent: WO-03/009746 (2003-02-01), None
Barsky et al., “Mathematical Methods in CAGD,” Vanderbilt Univ. Press, (2001) pp. 1-10.
Kung, Micro-optical wavelength detectors, http://clynlish.stanford.edu/˜hlkung/research.html, printed Jun. 9, 2003, 3 pages.
Liang et al., Journal of Optical Society of America (1994) 11(7):1949-1957.
Naulleau et al., J. Vac. Sci. Technol. B (2000) 18(6):2939-2943.
Ohba et al., Japanese Journal of Applied Physics (1998) 37:3749-3753.
Platt et al., “History and Principles of Shack-Hartmann Wavefront Sensing,” Journal of Refractive Surgery (2001) vol. 17.
SPIEWeb Scholarly Journals, Optical Engineering vol. 38, No. 12, Dec. 1999, http://www.spie.org/web/journals/oe/oedec99.html, printed Jun. 9, 2003, 8 pages.
U.S. Appl. No. 10/014,037, filed Dec. 10, 2001.
U.S. Appl. No. 10/314,906, filed Dec. 9, 2002.
Dreher Andreas W.
Lai Shui T.
Morrison & Foerster / LLP
Ophthonix, Inc.
Sugarman Scott J
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