Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2006-08-31
2008-08-12
Mai, Lam T (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S155000
Reexamination Certificate
active
07411532
ABSTRACT:
A method for determining a minimization factor for improving linearity of an analog-to-digital converter including a plurality of components includes the steps of: (a) Evaluating integral non-linearity response of the apparatus to identify significant departures of the response greater than a predetermined amplitude and to relate each respective significant departure with a respective identified component. (b) Determining magnitude of each significant departure. (c) Identifying a trimming factor related with each component. (d) Determining a residual gap magnitude for each significant departure. The residual gap magnitude comprises the magnitude of the respective significant departure less the trimming factor related with the identified component. (e) Determining the minimization factor as a sum of the residual gap magnitudes for a selected plurality of the identified components.
REFERENCES:
patent: 5635937 (1997-06-01), Lim et al.
patent: 5659312 (1997-08-01), Sunter et al.
patent: 5712633 (1998-01-01), Bae
patent: 5861826 (1999-01-01), Shu et al.
patent: 5973631 (1999-10-01), McMullen et al.
patent: 6140949 (2000-10-01), Tsay et al.
patent: 6437724 (2002-08-01), Nagaraj
patent: 6882294 (2005-04-01), Linder et al.
Lin et al.; “A 13-b 2.5-MHz Self-Calibrated Pipelined A/D Converter in 3-microm CMOS”; IEEE Journal of Solid-State Circuits; vol. 26, No. 4; Apr. 1991; pp. 628-636.
Moreland et al.; “A 14-bit 100-Msample/s Subranging ADC”; IEEE Journal of Solid-State Circuits; vol. 35, No. 12; Dec. 2001; pp. 1791-1798.
Pelgrom et al.; “Transistor matching in analog CMOS applications”; IEEE International Electron Devices Meeting (IEDM '98) Technical Digest; Dec. 1998; pp. 915-918.
Nguyen Kevin Quynh
Zanchi Alfio
Brady III Wade J.
Mai Lam T
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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