Method for determining information about the internal...

Details Method for determining information about the internal... Method for determining information about the internal...

2006-11-03

2009-06-30

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S750010, C324S512000

Reexamination Certificate

active

07554352

ABSTRACT:
A novel a method for determining the internal operation of an integrated circuit (IC) includes measuring electromagnetic (EM) emissions from the integrated circuit chip and analyzing the EM emissions. In a particular method, the EM emissions from the IC are measured using an RF close end probe. In a particular method, the electromagnetic emissions are measured with the IC configured in various ways. In the normal operating mode, the emissions are measured while the IC is provided with power and any external clock signal(s). After measuring the emissions of the IC in normal operating mode, the IC is reconfigured by disabling the external clock signal(s) to the IC and remeasuring the emissions. The external clock signal is disabled by disconnecting the power to the IC, disabling the external clock signal, and then reconnecting power to the IC. In yet a third test mode, the external clock signal is reenabled while power continues to be supplied to the IC. Information about the presence and/or proper functioning of internal clocks of the IC can be determined by analyzing the spectral scan data obtained in one or more of the three test modes.

REFERENCES:
patent: 5300879 (1994-04-01), Masuda et al.
patent: 5714888 (1998-02-01), Naujoks
patent: 6281697 (2001-08-01), Masuda et al.

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