Chemistry: electrical and wave energy – Processes and products – Processes of treating materials by wave energy
Patent
1989-12-20
1992-01-14
Tung, T.
Chemistry: electrical and wave energy
Processes and products
Processes of treating materials by wave energy
2041532, 20415318, 204425, 204426, G01N 27406
Patent
active
050807650
ABSTRACT:
Apparatus and method for determining the identity and concentration of one or more components in a test atmosphere having a known concentration of oxygen. A solid electrolyte oxygen sensor is used, having a first solid electrolyte wall in contact with, and interposed between, a first electrode and a second electrode and a second solid electrolyte wall in contact with, and interposed between a third electrode and a fourth electrode. The second and fourth electrodes are in communication with the test atmosphere. A partition wall separates the first and third electrodes forming a first chamber bounded by the first wall and the partition wall and a second chamber bounded by the partition wall and the second wall. Diffusion limiting means inhibit gas-flow of the gas from the test atmosphere to the first chamber and from the first chamber to the second chamber. A first negative voltage (or positive voltage when the unknown component has a concentraion larger than that of a stoichiometric gas mixture) is applied to the first and second electrodes generating a first electrical current on a first electric current plateau. Simultaneously the EMF across the third and fourth electrodes is measured. These two numbers are correlated with a table to determine gas component identity and concentration. Alternatively a first negative voltage is applied to the first and second electrodes generating a first electrical current. Simultaneously a second negative voltage is applied to the third and fourth electrodes generating a second electrical current. The magnitudes of said first and second voltages are in contrast to each other (the first voltages is low and the second voltage is high or vise verse, with their difference kept at least 100 mV). The second current is measured and is correlated with a figure to determine gas concentration or hydrogen-equivalent gas concentration.
REFERENCES:
patent: 2773237 (1956-12-01), Offutt et al.
patent: 4450065 (1984-05-01), Yamada et al.
patent: 4722779 (1988-02-01), Yamada et al.
patent: 4770760 (1988-09-01), Noda et al.
patent: 4909072 (1990-03-01), Logothetis et al.
Soviet Inventions Illustrated, El Section, Week 8720, Jul. 1, 1987.
Soviet Inventions Illustrated, El Section, Week 8343, Dec. 7, 1983.
Su-Il Pyun, Y-E. Ihm, "Electrical conduction of partially stabilized zirconia Zr.sub.0.94 Ca.sub.0.06 O.sub.1.94 as a function of temperature and oxygen partial pressure" J. of Mat. Sci. 17 2577-2584 (1982).
Kennedy Daniel T.
MacAllister Burton W.
Wang Da Y.
GTE Laboratories Incorporated
Ruoff Carl F.
Tung T.
LandOfFree
Method for determining identification and concentration of an at does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for determining identification and concentration of an at, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining identification and concentration of an at will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-539205