Optics: measuring and testing – Crystal or gem examination – Axes determination
Patent
1987-02-06
1988-10-18
Evans, F. L.
Optics: measuring and testing
Crystal or gem examination
Axes determination
356301, G01J 344, G01N 2165
Patent
active
047782692
ABSTRACT:
In a method for determining orientation of a crystal with polarization selective Raman microprobe spectroscopy, polarization angles of both light incident on the crystal and Raman scattered light emitted from the crystal are varied coincidently in ordinary circumstances and only either one of the polarization angles is varied in only case that intensity of the scattered beam does not change substantially in spite of the coincident variation of both the polarization angles.
REFERENCES:
Appl. Phys. Lett., vol. 44, 1984, pp. 535-537 by J. B. Hopkins et al.
Appl. Phys. Lett., vol. 59, 1986, pp. 1103-1110 by J. B. Hopkins et al.
Inoue Yasuo
Kusunoki Shigeru
Nishimura Tadashi
Sugahara Kazuyuki
Evans F. L.
Mitsubishi Denki & Kabushiki Kaisha
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