X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2006-06-06
2006-06-06
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S018000, C378S019000
Reexamination Certificate
active
07056018
ABSTRACT:
A method is for determining correction coefficients or parameters, in particular channel correction coefficients and/or spacing coefficients, for detector channels for a computed tomograph. In the method, a scan is carried out in order to obtain a sinogram of a phantom (11) which is formed with a smooth cross-sectional profile and is inserted into the computed tomograph in such a way that two or more different attenuation values are detected in a full scan of virtually all the detector channels (3). Attenuation profiles that are obtained from the sinogram are subjected to high-pass filtering for each projection of the scan, in order to obtain discrepancies of an ideal profile which is predetermined by the phantom (11). A model function is matched to the discrepancies that are obtained for each of the detector channels (3) as a function of the detected attenuation values, from which the coefficients or parameters are obtained. The method allows the channel correction coefficients to be determined easily, and the spacing coefficients also can be determined easily at the same time.
REFERENCES:
patent: 5095431 (1992-03-01), Feldman et al.
patent: 5214578 (1993-05-01), Cornuejols et al.
patent: 5225979 (1993-07-01), Feldman et al.
Stierstorfer Karl
Stoeger-Haselboeck Thomas
Glick Edward J.
Harness & Dickey & Pierce P.L.C.
Siemens Aktiengesellschaft
Thomas Courtney
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