Method for determining antenna near-fields from measurements on

Communications: radio wave antennas – Antennas – Measuring signal energy

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

455 67, G01R 2910

Patent

active

042019877

ABSTRACT:
A method for determining antenna near-fields from measurements on a spherical surface. Phase and intensity values are measured by scanning a probe antenna over a spherical surface. The method applies both to planar or conformal antennas. The spherical surface may be in the Fresnel or Fraunhofer regions. The field at the antenna is computed utilizing the complex conjugate of the measured field. As a result, the source antenna at the point at which the antenna radiating field is evaluated is inside the measurement surface. Far-field patterns can be computed from the near-fields reconstructed from the spherical hologram surface.

REFERENCES:
Bates & Napier; Proceedings I.R.E.E. Australia, vol. 32, No. 4, Apr. 1971, p. 164-166.
Test Procedure for Antennas; IEEE No. 149, Jan. 1965; pp. 8-17.
Jull, Estimation of Aerial Radiation Patterns from Limited Near-Field Measurements, IEE vol. 110, No. 3, pp. 501-506 (1963).
Bennett et al.; Microwave Holographic Metrology of Large Reflector Antennas, AP-24, No. 3, May 1976, pp. 295-303.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for determining antenna near-fields from measurements on does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for determining antenna near-fields from measurements on , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining antenna near-fields from measurements on will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1007542

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.