Method for determining anisotropy of 1-D conductor or...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000

Reexamination Certificate

active

07816906

ABSTRACT:
A method is provided for determining the anisotropy of alignment of a random array of 1-D conductive elements (e.g., carbon nanotube or silicon nanowire) formed on a substrate. A pattern of a plurality of electrodes are arranged on the substrate containing the 1-D conductive elements and a plurality of electrical property measurements are performed in a plurality of different directions between the plurality of electrodes. The plurality of measurements are combined together to generate a total measurement sum of electrical property measurements between the various electrodes. The measured electrical property is determined between a selected pair of the plurality of electrodes along a selected direction extending between the selected pair of electrodes. The anisotropy of alignment of the 1-D conductive elements on the substrate along the selected direction is determined based on a ratio of the measured electrical property between the selected pair of electrodes versus the total measurement sum.

REFERENCES:
patent: 5049347 (1991-09-01), Magill et al.
patent: 5576833 (1996-11-01), Miyoshi et al.
patent: 6252412 (2001-06-01), Talbot et al.
patent: 6764628 (2004-07-01), Lobovsky et al.
patent: 6822724 (2004-11-01), Ogishima et al.
patent: 7067328 (2006-06-01), Dubrow et al.
patent: 7135728 (2006-11-01), Duan et al.
patent: 7442926 (2008-10-01), Han et al.
patent: 2008/0023693 (2008-01-01), Dubrow et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for determining anisotropy of 1-D conductor or... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for determining anisotropy of 1-D conductor or..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining anisotropy of 1-D conductor or... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4220805

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.