Method for determining an exposure dose and exposure apparatus

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S296000, C430S942000

Reexamination Certificate

active

07811727

ABSTRACT:
A method of determining an exposure dose for writing a pattern using an electron beam writer determines a target dose in the exposure region to obtain a predetermined energy deposition in a specific position of the exposure region, the predetermined energy deposition being larger than a reference energy deposition in the non-exposure region. The target dose is locally increased in a marginal region of the exposure region (the marginal region being adjacent the exposure boundary) to a value that obtains an energy deposition in the marginal region higher than the predetermined energy deposition. Optionally, the target dose can be locally decreased in an intermediate region of the exposure region (the intermediate region being adjacent the marginal region) to a value that obtains an energy deposition in the intermediate region smaller than the predetermined energy deposition. Also provided is an exposure device for carrying out the method.

REFERENCES:
patent: 5808892 (1998-09-01), Tu
patent: 6436607 (2002-08-01), Lozes et al.
patent: 6475684 (2002-11-01), Ki
patent: 6783905 (2004-08-01), Yang
patent: 2001/0016295 (2001-08-01), Choi et al.
patent: 2003/0124442 (2003-07-01), Yang
patent: 59-208720 (1984-11-01), None
patent: 62-086718 (1987-04-01), None
patent: 02202015 (1990-08-01), None
European Search Report EP 05 11 0971.
Japanese Office action for Japanese Patent App. No. 2006-312259 and English translation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for determining an exposure dose and exposure apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for determining an exposure dose and exposure apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining an exposure dose and exposure apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4164842

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.