Method for determining absolute reflectance of a material in the

Details Method for determining absolute reflectance of a material in the Method for determining absolute reflectance of a material in the

1990-02-01

1991-09-03

Fields, Carolyn E.

Radiant energy

Invisible radiant energy responsive electric signalling

Ultraviolet light responsive means

356445, 356448, G01J 142

Patent

active

050457047

ABSTRACT:
A method for determining a value of absolute reflectance of a material at a predetermined wavelength, in the ultraviolet range from its measured reflectance which includes system losses contributed by optics, illumination sources, detectors, etc. The method involves the measurement of reflectance from a known material such as single crystal silicon whose absolute reflectance is well known, dividing the measured value by the absolute value to obtain a system efficiency coefficient at the known wavelength and then, without changing the illumination or optics, measuring the reflectance of the unknown material and applying this coefficient to this measured value to obtain its absolute value.

REFERENCES:
patent: 4035085 (1977-07-01), Seiner
patent: 4455090 (1984-06-01), Roberts
patent: 4575252 (1986-03-01), Akiyama
"Measurement and Analysis of Reflectance Spectra of SiP2", Applied Optics/vol. 11, No. 9 (Sep. 1972) John R. Barkley, pp. 1928-1935.

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