Method for determining a radiation power and an exposure...

Details Method for determining a radiation power and an exposure... Method for determining a radiation power and an exposure...

2005-03-31

2008-08-26

Nguyen, Sang (Department: 2886)

Optics: measuring and testing

Of light reflection

C356S005110, C250S214100, C250S341100

Reexamination Certificate

active

07417736

ABSTRACT:
Method for determining a mean radiation powerPrad0_of electromagnetic radiation of a radiation source, the radiation being intensity-modulated with modulation frequency ω0, in a predetermined time interval. The method provides a reflector designed to reflect electromagnetic radiation of the radiation source and electromagnetic radiation of a test radiation source, irradiates a predetermined area of the reflector with the source electromagnetic radiation, at least partially irradiates the predetermined area of the reflector with electromagnetic radiation of the test radiation source, measures a ω0-modulated power component Ptest,ω0(t) of a reflected test radiation power Ptest(t) of an electromagnetic radiation of the test radiation source, the radiation being reflected from the area, in the predetermined time interval, determines a mean valuePtest,ω00_of the measured ω0-modulated power component Ptest,ω0(t) of the reflected test radiation power Ptest(t) in the predetermined time interval, and determines the mean radiation powerPrad0_from the relationshipPrad0_=a·Ptest,ω00_,where a is a predetermined constant.

REFERENCES:
patent: 4828389 (1989-05-01), Gubbins et al.
patent: 4830486 (1989-05-01), Goodwin
patent: 5646733 (1997-07-01), Bieman
patent: 6777684 (2004-08-01), Volkov et al.
patent: 6825455 (2004-11-01), Schwarte
patent: 2002/0060296 (2002-05-01), Van Der Veen
patent: 2003/0146391 (2003-08-01), Kleinschmidt et al.
patent: 24 46 610 (1976-04-01), None
patent: 29 49 564 (1981-11-01), None
patent: 103 23 664 (2004-12-01), None
patent: 1 017 086 (2000-07-01), None
patent: WO-03/046494 (2003-06-01), None

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