Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2006-08-15
2006-08-15
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C250S231130, C250S231140, C250S227260
Reexamination Certificate
active
07092108
ABSTRACT:
A method for position determination that includes generating first and second position-dependent scanning signals, transmitting the first and second position-dependent scanning signals from a scanning location via corresponding first and second scanning channels to corresponding first and second storage elements, storing corresponding first and second instantaneous values present at the first and second storage elements at corresponding first and second storage times. Forming a measured position value from the first stored instantaneous value and the second stored instantaneous value. A difference exists between corresponding first and second transit times of the first and second position-dependent scanning signals in the corresponding first and second scanning channels, the difference is compensated by individually delaying the first and second position-dependent scanning signals, so that the stored first and second instantaneous values have appeared at a common time at the scanning location.
REFERENCES:
patent: 4225931 (1980-09-01), Schwefel
patent: 4462083 (1984-07-01), Schwefel
patent: 4630928 (1986-12-01), Klingler et al.
patent: 5066953 (1991-11-01), Lengenfelder et al.
patent: 5594241 (1997-01-01), Li et al.
patent: 5956659 (1999-09-01), Spies et al.
patent: 6265992 (2001-07-01), Hagl et al.
patent: 6806461 (2004-10-01), Strasser
patent: 2004/0026603 (2004-02-01), Burgschat et al.
patent: 27 29 697 (1979-01-01), None
Drescher Jörg
Hausschmid Mathias
Holzapfel Wolfgang
Huber-Lenk Herbert
Reiter Herbert
Brinks Hofer Gilson & Lione
Dr. Johannes Heidenhain GmbH
Pham Hoa Q.
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