X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2007-12-18
2007-12-18
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S146000
Reexamination Certificate
active
11552545
ABSTRACT:
The magnification Mreffor a line scan camera can be found by exploiting a difference in the way Mrefaffects the notion of ‘focus’ in the x and y directions. Mrefenters into the calculations for selecting z while focusing in the y direction, but not in x. A thin opaque calibration target is provided at a convenient height in z called the reference plane, and has straight edges aligned parallel to the x and y directions. To find Mrefthe line scan camera forms images of the calibration target over a range of trial z values known to include the height of the calibration target. An arbitrary and possibly incorrect trial value Miof Mrefis then assumed and many slices of the calibrations target are calculated. Within these slices the edge parallel to the x direction will be sharply defined for some zx, while at some other zythe edge parallel to the y direction will be sharply defined. Make a note of ei=zy. Repeat these steps for some number different trial Mithat cover the plausible range of Mref. Now fit a curve (e.g., a quadratic) to the data set {(ei, Mi)}, and find the y-intercept (where e=0). The associated value of M is the magnification Mrefin the reference plane containing the calibration target, and we found it without knowing the actual length of any part of the calibration target.
REFERENCES:
patent: 4260898 (1981-04-01), Annis
patent: 5418832 (1995-05-01), Barnes
patent: 6990174 (2006-01-01), Eskelinen
patent: 2004/0213380 (2004-10-01), Shaw et al.
Agilent Technologie,s Inc.
Glick Edward J.
Kiknadze Irakli
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