Method for detection of manufacture defects

Details Method for detection of manufacture defects Method for detection of manufacture defects

2005-09-13

2005-09-13

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Quality evaluation

C382S144000, C382S149000, C700S110000, C702S083000, C702S182000, C716S030000

Reexamination Certificate

active

06944561

ABSTRACT:
A novel method for detection of manufacture defects is disclosed. The invented method is designed to discover root cause machine sets that cause defects in product manufactured in a process wherein a plurality of machines is involved. The method includes obtaining manufacture data that relate to manufacture of products in the manufacture process, generating a candidate list of machine set by analyzing the manufacture data wherein the machine set includes machines relative to defects in the products, and identifying root cause machine sets from the list of machine set wherein the root cause machine sets include machines highly related to the defects.

REFERENCES:
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patent: 5991699 (1999-11-01), Kulkarni et al.
patent: 6148099 (2000-11-01), Lee et al.
patent: 6202037 (2001-03-01), Hattori et al.
patent: 6341241 (2002-01-01), Mugibayashi et al.
patent: 6826735 (2004-11-01), Ono et al.

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