Method for detecting vertical transfer defects in image sensors

Details Method for detecting vertical transfer defects in image sensors Method for detecting vertical transfer defects in image sensors

2005-05-12

2009-06-23

Ye, Lin (Department: 2622)

Television

Camera, system and detail

Combined image signal generator and general image signal...

C348S250000, C348S311000

Reexamination Certificate

active

07551213

ABSTRACT:
A charge transfer implemented by a transfer section for transferring charges stored in image sensor elements along one direction on a surface where the image sensor elements are disposed is halted for a predetermined length of time. The charges are transferred from the transfer section without reading the charges from the image sensor elements after the charge transfer is halted for the predetermined length of time. A position where a defect is generated in an image pickup sensor is identified based on signal levels of the transferred charges. A defective signal level of the image pickup sensor generated on a line including the defect-generating position and in parallel with the one direction is corrected. As a result of the foregoing process, a display failure is precisely corrected.

REFERENCES:
patent: 6614472 (2003-09-01), Yamashita
patent: 7317480 (2008-01-01), Cho et al.
patent: 2004/0165103 (2004-08-01), Hashimoto et al.
patent: 2002-84463 (2002-03-01), None

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