Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-09-13
2005-09-13
Patidar, Jay (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S691000, C324S762010, C324S658000
Reexamination Certificate
active
06943567
ABSTRACT:
When using solenoid coils in an explosion-hazard environment, in order that no sparks are produced in the event of a discontinuity in an electrical line leading to the solenoid coil, two or more identical zener diodes are connected in parallel with one another and to the solenoid coil. In order to verify the operability of all the zener diodes which are connected in parallel with one another and to the solenoid coil, the electrical values of the zener diodes and of the solenoid coil are measured before assembly. The total capacitance of the circuit arrangement is measured after assembly. The capacitance of the solenoid coil is subtracted from the total capacitance, and the remaining value is divided by the number of parallel-connected zener diodes. The result is compared with the capacitance of a single zener diode, with the magnitude of the difference between these values being used as a criterion for the operability of the zener diodes.
REFERENCES:
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patent: 1235423 (1967-03-01), None
patent: 120721 (1976-06-01), None
patent: 3917706 (1990-10-01), None
Simulation and Modeling, by Saleh et al., Circuits and Devices, IEEE, Mar. 1993.
“Surge/Noise Suppression Within Electrical Connectors”, Eric J Paulus, May 1-4, 1994, New York, vol. Conf. 44, pp. 239-247.
“Low Current and Capacitance Measurement Technique”, El-Kareh and J. Zauchner, Nov. 1, 1975, New York, vol. 18 No. 6, pp. 1782-1783.
Hartmann Peter
Panzer Karlheinz
Benson Walter
Bosch Rexroth AG
Farber Martin A.
Patidar Jay
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