Image analysis – Pattern recognition – Feature extraction
Patent
1997-08-21
1999-07-13
Shalwala, Bipin
Image analysis
Pattern recognition
Feature extraction
382218, 382228, 382170, 382282, G06K 946, G06K 966, G06K 900, G06K 920
Patent
active
059237805
ABSTRACT:
In a process for detecting target patterns in a texture with which a system state can be represented as a distribution of points in an n-dimensional space, anisotropic scaling factors a.sub.ji are determined which are characteristic of the relationship between the projection of the point density onto coordinate j and the distance to examined point P.sub.i. A target is detected if the distribution of scaling factors deviates from predetermined comparison distributions of systems without target patterns.
REFERENCES:
patent: 4441205 (1984-04-01), Berkin et al.
patent: 4481593 (1984-11-01), Bahler
patent: 4625289 (1986-11-01), Rockwood
patent: 5016173 (1991-05-01), Kenet et al.
patent: 5220614 (1993-06-01), Crain
patent: 5335291 (1994-08-01), Kramer et al.
J.W. Handley et al., "Chaos and Fractal Algorithms Applied to Signal Processing and analysis", Simulations, vol. 60, No. 4, Apr. 1993.
Atmanspacher et al, "Determination of f(.alpha.) for a limited random point set" Physical Review A vol. 40, No. 7 (Oct. 1, 1989) pp. 3954-3963.
Ebeling et al, "Detecting structure in two dimensions combining Voronoi tessellation and percolation" Physical Review E vol. 47, No. 1 (Jan. 1993) pp. 704-710.
Schwenker et al, "Methoden zur Clusteranalyse und Visualisierung hochdimensionaler Datenmengen" DAGM Symposium (Sep. 13-15, 1995) pp. 547-553.
Morfill Gregor
Rath Christoph
Max-Planck-Gesellschaft
Shalwala Bipin
LandOfFree
Method for detecting target patterns in a texture region using p does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for detecting target patterns in a texture region using p, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for detecting target patterns in a texture region using p will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2284514