Method for detecting opens through time variant current measurem

Details Method for detecting opens through time variant current measurem Method for detecting opens through time variant current measurem

1996-01-16

1999-11-23

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324719, G01R 3126

Patent

active

059906995

ABSTRACT:
A method for detecting open circuits in a semiconductor device, more specifically in a static CMOS device. A device to be tested is powered-up and the clock on the device is stopped so that the device enters a quiescent state. Once the device has reached a quiescent state a first current is measured and after a specified period of time a second current is also measured. The first current and the second current are then compared to determine if there is a defect, i.e. an open circuit, in the device. The determination as to whether or not a device is defective is based upon the difference between the first and second current measurements.

REFERENCES:
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patent: 4748652 (1988-05-01), Nagai et al.
patent: 5025344 (1991-06-01), Maly et al.
patent: 5057774 (1991-10-01), Verhelst et al.
patent: 5519335 (1996-05-01), Thomas
patent: 5552744 (1996-09-01), Burlison et al.

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